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| CCD
Colour camera : |
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Various camera options are available as
per the application needs, chip size ( 1/4", 1/3", 1/2",
2/3" ), single chip / three chip, with variety of frame grabbing
speeds and resolution, from different makes like Wattec, JVC, Sony,
Pulnix
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| Camera
Adapter |
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(For any microscope - Carl Zeiss , Nikon , Olympus , Unitron , Leica etc.)
Opto Mechanical adapter -
CCD to Microscope interface, for any
microscope. Specific adaptor with magnification factor of 0.5 X
or the one suitable, can be offered depending upon application.
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| Image Grabber Card |
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High resolution Scientific Image grabber card .
Spatial Resolution:
640 x 480 (60 Hz); 768 x 576 (50 Hz),
Video Format:
Composite video
and S-video (Y/C) formats; RS-170, RS-330, and NTSC (60 Hz) or CCIR
and PAL (50 Hz); interlaced; software selectable.
Inputs:
1 active
input, composite or S-video,
AC coupled Video Signal:
1volt peak
to peak, 75 ohms. It enables the acquisition of a standard monochrome,
composite color, or S-video color image.
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| Software
Modules : |
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A powerful software developed with advanced image processing techniques
and algorithms offering perfection and reliability in test results.
Advanced Features:
Image Enhancement -
H.S.I., contrast, sharpening, edge detection,
selective zoom.
Spatial filters -
High pass, low pass, gamma, median,
prewitt, sobel & roberts, laplacian, Gaussian, thinning, errosion,
dialation, iteration, prunning, inverse adaptive filtering.
Kernel Algorithm -
Facilitating user defined sequential operation.
Multiple image display, annotation, selection of objects and region
of interest.
Modules
• Grain size measurement, by Heyn intercept
and Jeffries planimetry
method. (ASTM
- E 112 / E 1382)
• Austenitic grain size measurement.
• Percentage phase analysis.
( Area Fraction ) ( ASTM - E - 562 )
• Linear measurements like - plating
/ coating / decarburization / banding
etc .
• Nodule count , % Nodularity
analysis , distribution, nodule classification
etc. (ASTM
A 247 )
• Graphite Flake analysis for
size class and separation of A, C, D, E flakes
&
their exact % estimation (ASTM A 247 ).
• Inclusion Analysis - ( ASTM
- E 45 / E 1122 ) Separation, and rating.
• Dendritic arm spacing .
• Porosity measurement.
• Automatic primary silicon measurement in aluminium alloy.
• Image database management
software with facility of comparison of images.
• Particle count & size analysis.
• Multi-layer measurements for PVD.
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| PCB Module |
Cement Module |
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